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Scanning probe microscope
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211	Ultramicroscopy[removed]–93 Contents lists available at SciVerse ScienceDirect Ultramicroscopy journal homepage: www.elsevier.com/locate/ultramic Add to Reading List Source URL: bioenergycenter.org Language: English - Date: 2013-12-09 15:24:05 Chemistry Atomic force microscopy Microscopy Ultrasonic force microscopy Nanometrology Resonance Microscope Nanotechnology NanoWorld Scanning probe microscopy Science Scientific method
212	Field Enhancement and Work Function Difference of IrO2 Nano-Emitter Arrays using EFM and SKPM Spectroscopy D. C.-S. Chiang, Z.-F.P. Lei , R. Barrowcliff, F. Zhang * Washington State University Vancouver, WA 98686, Add to Reading List Source URL: www.nsti.org Language: English - Date: 2012-06-27 17:06:43 Chemistry Condensed matter physics Nanomaterials Intermolecular forces Kelvin probe force microscope Surface chemistry Electrostatic force microscope Nanorod Atomic force microscopy Physics Scanning probe microscopy Science
213	Abstract for an Invited Paper for the MAR06 Meeting of The American Physical Society STM Manipulation of Nanoscale Biomolecules SAW-WAI HLA, Ohio University Add to Reading List Source URL: absimage.aps.org Language: English - Date: 2005-12-16 16:14:46 Hydrocarbons Vitamins Chemistry Science Scientific method Scanning tunneling microscope Scanning probe microscopy Nanotechnology Carotene
214	Friction, Adhesion, and Deformation: Dynamic Measurements with the Atomic Force Microscope Phil Attard Ian Wark Research Institute, University of South Australia, Mawson Lakes SA 5095 Australia (J. Adhesion Sci. Technol. Add to Reading List Source URL: personal.chem.usyd.edu.au Language: English - Date: 2003-08-20 22:30:41 Intermolecular forces Mechanical engineering Scanning probe microscopy Classical mechanics Friction Atomic force microscopy Contact mechanics Rail adhesion Surface forces apparatus Physics Chemistry Materials science
215	PAUL SCHERRER INSTITUT Technology Transfer R&D Services Add to Reading List Source URL: www.psi.ch Language: English - Date: 2014-11-28 07:19:08 Microscopy Microscope Electron microscope Scanning electron microscope Magnetic force microscope Optical microscope Scanning tunneling microscope Characterization Vibrational analysis with scanning probe microscopy Scientific method Scanning probe microscopy Science
216	Two-Dimensional Fine Particle Positioning Under Optical Microscope Using a Piezoresistive Cantilever as a Manipulator Metin Sitti and Hideki Hashimoto Institute of Industrial Science, University of Tokyo, Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Chemistry Atomic force microscopy Nanotechnology Cantilever Force spectroscopy Magnetic force microscope Scanning probe microscopy Science Scientific method
217	Advanced Robotics Journal, Vol. X, No. Y, 2002 (to appear) SCALED TELEOPERATION SYSTEM FOR NANO SCALE INTERACTION AND MANIPULATION Metin Sitti,1,∗ Baris Aruk,2 Hirohaki Shintani2 and Hideki Hashimoto2 1 Mechanical Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Technology Atomic force microscopy Scanning tunneling microscope Haptic technology AFM probe Contact mechanics Test probe Piezoelectricity Photoconductive atomic force microscopy Scanning probe microscopy Science Scientific method
218	Teleoperated and Automatic Nanomanipulation Systems using Atomic Force Microscope Probes Metin Sitti Dept. of Mechanical Engineering and The Robotics Institute, Carnegie Mellon University [removed] Abstract Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Nanotechnology Intermolecular forces Atomic force microscopy Nanoindentation Nanoparticle Vibrational analysis with scanning probe microscopy Thermal Probe Lithography Scanning probe microscopy Science Scientific method
219	IEEE/ASME TRANSACTIONS ON MECHATRONICS, VOL. 5, NO. 2, JUNE[removed]Controlled Pushing of Nanoparticles: Modeling and Experiments Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:36 Nanotechnology Intermolecular forces Atomic force microscopy Nanoparticle Electron Magnetic force microscope Local oxidation nanolithography Scanning probe microscopy Physics Science
220	IEEE/ASME TRANSACTIONS ON MECHATRONICS, VOL. 8, NO. 3, SEPT[removed]Atomic Force Microscope Probe based Controlled Pushing for Nano-Tribological Characterization Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Classical mechanics Force Introductory physics Nanotechnology Atomic force microscopy AFM probe Friction Sliding Scanning probe microscopy Physics Science Mechanical engineering

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